Giessibl, Franz: search on Z-Library

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1

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Principles and Applications of the qPlus Sensor

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 1019 KB

english, 2009

2

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Electrochemical Applications of Frequency Modulation Atomic Force Microscopy

Morita, Seizo, Giessibl, Franz J., Meyer, Ernst, Wiesendanger, Roland

Year:

2015

Language:

english

File:

PDF, 1.31 MB

english, 2015

3

Advances in atomic force microscopy

Giessibl, Franz J.

Journal:

Review of Modern Physics

Year:

2003

Language:

english

File:

PDF, 3.20 MB

english, 2003

4

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

Giessibl, Franz J.

Journal:

Physical Review B

Year:

1997

Language:

english

File:

PDF, 150 KB

english, 1997

5

Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips

Wastl, Daniel S., Judmann, Michael, Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Year:

2015

Language:

english

File:

PDF, 5.82 MB

english, 2015

6

Lateral manipulation of single iron adatoms by means of combined atomic force and scanning tunneling microscopy using CO-terminated tips

Berwanger, Julian, Huber, Ferdinand, Stilp, Fabian, Giessibl, Franz J.

Journal:

Physical Review B

Year:

2018

Language:

english

File:

PDF, 11.52 MB

english, 2018

7

Interatomic force laws that evade dynamic measurement

Sader, John E., Hughes, Barry D., Huber, Ferdinand, Giessibl, Franz J.

Journal:

Nature Nanotechnology

Year:

2018

Language:

english

File:

PDF, 1.71 MB

english, 2018

8

Higher-harmonic atomic force microscopy

Franz J. Giessibl

Journal:

Surface and Interface Analysis

Year:

2006

Language:

english

File:

PDF, 1.73 MB

english, 2006

9

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

Schneiderbauer, Maximilian, Wastl, Daniel, Giessibl, Franz J

Journal:

Beilstein Journal of Nanotechnology

Year:

2012

Language:

english

File:

PDF, 4.27 MB

english, 2012

10

Exploring the nanoworld with atomic force microscopy

Giessibl, Franz J., Quate, Calvin F.

Journal:

Year:

2006

Language:

english

File:

PDF, 644 KB

english, 2006

11

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Self-assembly of Organic Molecules on Insulating Surfaces

Morita, Seizo, Giessibl, Franz J., Meyer, Ernst, Wiesendanger, Roland

Year:

2015

Language:

english

File:

PDF, 1.12 MB

english, 2015

12

Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development

Andrei Ionescu, Elisabeth Wutscher, Eugenio Brambilla, Sibylle Schneider-Feyrer, Franz J. Giessibl, Sebastian Hahnel

Journal:

European Journal of Oral Sciences

Year:

2012

Language:

english

File:

PDF, 390 KB

english, 2012

13

Atomic resolution on Si(111)-(7Ã7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Giessibl, Franz J.

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 446 KB

english, 2000

14

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 1019 KB

english, 2009

15

Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope

Peronio, Angelo, Okabayashi, Norio, Griesbeck, Florian, Giessibl, Franz

Journal:

Review of Scientific Instruments

Year:

2019

File:

PDF, 1.45 MB

2019

16

Atomare Ladungszustände unter dem Rasterkraftmikroskop

Leo Gross, Fabian Mohn, Gerhard Meyer, Jascha Repp, Franz J. Giessibl

Journal:

Physik in unserer Zeit

Year:

2009

Language:

german

File:

PDF, 218 KB

german, 2009

17

Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy

Wastl, Daniel S., Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Year:

2014

Language:

english

File:

PDF, 3.75 MB

english, 2014

18

Atomically Resolved Chemical Reactivity of Small Fe Clusters

Berwanger, Julian, Polesya, Svitlana, Mankovsky, Sergiy, Ebert, Hubert, Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2020

File:

PDF, 503 KB

2020

19

Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy

Hofmann, Thomas, Pielmeier, Florian, Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2014

Language:

english

File:

PDF, 577 KB

english, 2014

20

Publisher’s Note: Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy [Phys. Rev. Lett. 112, 066101 (2014)]

Hofmann, Thomas, Pielmeier, Florian, Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2014

File:

PDF, 21 KB

2014

21

Localization of the phantom force induced by the tunneling current

Wutscher, Thorsten, Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Physical Review B

Year:

2012

Language:

english

File:

PDF, 705 KB

english, 2012

22

[NanoScience and Technology] Noncontact Atomic Force Microscopy || The Atomic Structure of Two-Dimensional Silica

Morita, Seizo, Giessibl, Franz J., Meyer, Ernst, Wiesendanger, Roland

Year:

2015

Language:

english

File:

PDF, 1.90 MB

english, 2015

23

Investigating atomic details of the CaF2(111) surface with a qPlus sensor

Giessibl, Franz J, Reichling, Michael

Journal:

Year:

2005

Language:

english

File:

PDF, 2.30 MB

english, 2005

24

[NanoScience and Technology] Noncontact Atomic Force Microscopy Volume 99 || Method for Precise Force Measurements

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 1.72 MB

english, 2009

25

Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

Wutscher, Elisabeth, Giessibl, Franz J.

Journal:

Review of Scientific Instruments

Year:

2011

Language:

english

File:

PDF, 941 KB

english, 2011

26

High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork

Giessibl, Franz J.

Journal:

Applied Physics Letters

Year:

1998

Language:

english

File:

PDF, 549 KB

english, 1998

27

Influence of matrix and filler fraction on biofilm formation on the surface of experimental resin-based composites

Ionescu, Andrei, Brambilla, Eugenio, Wastl, Daniel S., Giessibl, Franz J., Cazzaniga, Gloria, Schneider-Feyrer, Sibylle, Hahnel, Sebastian

Journal:

Journal of Materials Science: Materials in Medicine

Year:

2015

Language:

english

File:

PDF, 645 KB

english, 2015

28

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Nanostructured Surfaces of Doped Alkali Halides

Morita, Seizo, Giessibl, Franz J., Meyer, Ernst, Wiesendanger, Roland

Year:

2015

Language:

english

File:

PDF, 1.42 MB

english, 2015

29

Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Reveals that Sulfur is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions

Pürckhauer, Korbinian, Kirpal, Dominik, Weymouth, Alfred John, Giessibl, Franz J.

Journal:

ACS Applied Nano Materials

Year:

2019

File:

PDF, 2.15 MB

2019

30

CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces

Schneiderbauer, Maximilian, Emmrich, Matthias, Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2014

Language:

english

File:

PDF, 1.11 MB

english, 2014

31

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

Welker, Joachim, Illek, Esther, Giessibl, Franz J

Journal:

Beilstein Journal of Nanotechnology

Year:

2012

Language:

english

File:

PDF, 2.26 MB

english, 2012

32

Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts

Ternes, Markus, González, César, Lutz, Christopher P., Hapala, Prokop, Giessibl, Franz J., Jelínek, Pavel, Heinrich, Andreas J.

Journal:

Physical Review Letters

Year:

2011

Language:

english

File:

PDF, 681 KB

english, 2011

33

Giorgio Benedek: an extraordinary universal scientist

Giessibl, Franz J, Morita, Seizo, Morita, Seizo

Journal:

Journal of Physics Condensed Matter

Year:

2012

Language:

english

File:

PDF, 414 KB

english, 2012

34

Publisher Correction: Interatomic force laws that evade dynamic measurement

Sader, John E., Hughes, Barry D., Huber, Ferdinand, Giessibl, Franz J.

Journal:

Nature Nanotechnology

Year:

2019

File:

PDF, 568 KB

2019

35

Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Reveals that Sulfur is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions

Pürckhauer, Korbinian, Kirpal, Dominik, Weymouth, Alfred John, Giessibl, Franz J.

Journal:

ACS Applied Nano Materials

Year:

2019

Language:

english

File:

PDF, 2.15 MB

english, 2019

36

Dynamics of low-dimensional systems

Giessibl, Franz J, Morita, Seizo, Morita, Seizo

Journal:

Journal of Physics Condensed Matter

Year:

2012

Language:

english

File:

PDF, 44 KB

english, 2012

37

High-precision atomic force microscopy with atomically-characterized tips

Liebig, Alexander, Peronio, Angelo, Meuer, Daniel, Weymouth, Alfred John, Giessibl, Franz Joseph

Journal:

New Journal of Physics

Year:

2020

File:

PDF, 611 KB

2020

38

Helium and carbon: two friends for life

Giessibl, Franz J

Journal:

Journal of Physics Condensed Matter

Year:

2012

Language:

english

File:

PDF, 154 KB

english, 2012

39

Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures

Huber, Ferdinand, Giessibl, Franz J.

Journal:

Review of Scientific Instruments

Year:

2017

Language:

english

File:

PDF, 2.73 MB

english, 2017

40

Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip

Liebig, Alexander, Hapala, Prokop, Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Scientific Reports

Year:

2020

File:

PDF, 2.18 MB

2020

41

Physical interpretation of frequency-modulation atomic force microscopy

Giessibl, Franz, Bielefeldt, Hartmut

Journal:

Physical Review B

Year:

2000

Language:

english

File:

PDF, 119 KB

english, 2000

42

Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

Giessibl, Franz, Pielmeier, Florian, Eguchi, Toyoaki, An, Toshu, Hasegawa, Yukio

Journal:

Physical Review B

Year:

2011

Language:

english

File:

PDF, 1.04 MB

english, 2011

43

Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study

Gustafsson, Alexander, Okabayashi, Norio, Peronio, Angelo, Giessibl, Franz J., Paulsson, Magnus

Journal:

Physical Review B

Year:

2017

Language:

english

File:

PDF, 2.20 MB

english, 2017

44

Evaluating the potential energy landscape over single molecules at room temperature with lateral force microscopy

Weymouth, Alfred J., Riegel, Elisabeth, Matencio, Sonia, Giessibl, Franz J.

Journal:

Applied Physics Letters

Year:

2018

Language:

english

File:

PDF, 699 KB

english, 2018

45

Electron scattering in scanning probe microscopy experiments

Linda A. Zotti, Werner A. Hofer, Franz J. Giessibl

Journal:

Chemical Physics Letters

Year:

2006

Language:

english

File:

PDF, 442 KB

english, 2006

46

Erratum: Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy [Phys. Rev. Lett. 112 , 066101 (2014)]

Hofmann, Thomas, Pielmeier, Florian, Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2015

Language:

english

File:

PDF, 27 KB

english, 2015

47

Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions

PÃ¼rckhauer, Korbinian, Maier, Simon, Merkel, Anja, Kirpal, Dominik, Giessibl, Franz J.

Journal:

Review of Scientific Instruments

Year:

2020

File:

PDF, 8.19 MB

2020

48

AFM's path to atomic resolution

Franz J. Giessibl

Journal:

Materials Today

Year:

2005

Language:

english

File:

PDF, 1.49 MB

english, 2005

49

[NanoScience and Technology] Noncontact Atomic Force Microscopy ||

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 16.00 MB

english, 2009

50

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Non-contact Friction

Morita, Seizo, Giessibl, Franz J., Meyer, Ernst, Wiesendanger, Roland

Year:

2015

Language:

english

File:

PDF, 924 KB

english, 2015

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